🔍 Atomic Force Microscope
Scan surfaces atom by atom — cantilever probe with laser feedback
🤔 What Is an Atomic Force Microscope?
An AFM uses a nanoscale probe tip on a flexible cantilever to scan surfaces with sub-nanometer resolution. A laser beam reflects off the cantilever onto a photodetector, measuring tiny deflections as the tip traces the surface topography — building 3D height maps atom by atom.
Why does this matter? AFM can image any surface — metals, polymers, biological cells, even individual DNA strands — in air or liquid, without damaging the sample. Three scan modes (Contact, Tapping, Non-Contact) let you choose between resolution, gentleness, and speed for any application.
⚛️
Imaging
Individual atoms and molecules
📏
Metrology
Sub-nm height precision
🧬
Biology
Protein and DNA mapping
💎
Materials
Surface roughness analysis
🔧
Lithography
Nanoscale patterning
⚙️
Force Spectroscopy
Molecular binding forces
🚀 Quick Start
⚙️ Scan Parameters
📋 Event Log
AFM idle. Set parameters and press Start to begin scanning...
Z Height: 0.00 nm
Deflection: 0.00 nm
Phase: 0.0°
RMS Roughness: 0.00 nm
Scan Progress: 0%
Tip Wear: 0%
Force-Distance